Publications
An Autonomous Illumination System for Vehicle Documentation Based on Deep Reinforcement Learning
L. Leontaris, N. Dimitriou, D. Ioannidis, K. Votis, D. Tzovaras and E. Papageorgiou, “An Autonomous Illumination System for Vehicle Documentation Based on Deep Reinforcement Learning,” in IEEE Access, vol. 9, pp. 75336-75348, 2021, doi: 10.1109/ACCESS.2021.3081736
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Short Survey of Artificial Intelligent Technologies for Defect Detection in Manufacturing
E. I. Papageorgiou et al., “Short Survey of Artificial Intelligent Technologies for Defect Detection in Manufacturing,” 2021 12th International Conference on Information, Intelligence, Systems & Applications (IISA), 2021, pp. 1-7, DOI: 10.1109/IISA52424.2021.9555499.
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A Deep Regression Framework Towards Laboratory Accuracy in the Shop Floor of Microelectronics
A. Evangelidis, N. Dimitriou, L. Leontaris, D. Ioannidis, G. Tinker and D. Tzovaras, “A Deep Regression Framework Towards Laboratory Accuracy in the Shop Floor of Microelectronics,” in IEEE Transactions on Industrial Informatics, 2022, doi: 10.1109/TII.2022.3182343.
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Autoencoders for Anomaly Detection in an Industrial Multivariate Time Series Dataset
Theodoros Tziolas, Konstantinos Papageorgiou, Theodosios Theodosiou, Elpiniki Papageorgiou, Theofilos Mastos and Angelos Papadopoulos. “Autoencoders for Anomaly Detection in an Industrial Multivariate Time Series Dataset” in MDPI Engineering Proceedings, 2022, https://doi.org/10.3390/engproc2022018023.
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Aligning Emerging Technologies onto I4.0 principles: Towards a Novel Architecture for Zero-defect Manufacturing
G. Margetis, K. C. Apostolakis, N. Dimitriou, D. Tzovaras and C. Stephanidis, “Aligning Emerging Technologies onto I4.0 principles: Towards a Novel Architecture for Zero-defect Manufacturing,” 2022 IEEE 27th International Conference on Emerging Technologies and Factory Automation (ETFA), 2022, pp. 1-8, doi: 10.1109/ETFA52439.2022.9921492.
Wafer Map Defect Pattern Recognition using Imbalanced Datasets
T. Tziolas et al., “Wafer Map Defect Pattern Recognition using Imbalanced Datasets,” 2022 13th International Conference on Information, Intelligence, Systems & Applications (IISA), 2022, pp. 1-8, doi: 10.1109/IISA56318.2022.9904402.
Dilemmas in Legal Governance
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A systematic review on machine learning methods for root cause analysis towards zero-defect manufacturing
Papageorgiou K, Theodosiou T, Rapti A, Papageorgiou EI, Dimitriou N, Tzovaras D and Margetis G (2022), A systematic review on machine learning methods for root cause analysis towards zero-defect manufacturing. Front. Manuf. Technol. 2:972712. doi: 10.3389/fmtec.2022.972712
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4ZDM Workshop: OPTIMAI Progress
Achieved
N. Dimitriou.
European Zero Defect Manufacturing ZDM Landscape State of Play, 8 July 2021, virtual workshop.